Showing results: 31 - 45 of 126 items found.
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cPCIS-2642 Series -
ADLINK Technology Inc.
*Dual 3U CompactPCI® Systems, each with five peripheral card slots and one system slot*1/1 250 W CompactPCI® Power supplies*Temperature, voltage, and fan monitoring LEDs*Supports current sharing on +5 V, +3.3 V, and +12 V*PICMG® 2.11 47-pin power interface
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cPCIS-ET1100 Series -
ADLINK Technology Inc.
The cPCIS-ET1100 Series Subsystems are rack mountable, 3U in height, and designed for 3U CompactPCI cards and modules. They are ideal for industrial or transport applications where small chassis size with multifunctionality are important ample power capacity, a hot swap backplane and easy maintenance. Their ability to handle a wide range of temperatures and excellent shock and vibration characteristics make them suitable for operating in a rigorous environment. The cPCIS-ET1100 Series allows for custom configuration, giving system integrators maximum flexibility to build in specialized functionality.
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cPCIS-1202 -
ADLINK Technology Inc.
*Dual 3U CompactPCI® systems, each with five peripheral slots and one system slot*1/1 250 W CompactPCI® Power supplies*Suitable for both rack-mount and desktop applications*Comprehensive EMC shielding*Optional rear I/O configuration (cPCI 50mm depth RTMs)
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RK-609B -
ADLINK Technology Inc.
- Supports 10 slot PICMG backplane- Two 5.25" and two 3.5" external drive bays, one internal 3.5" drive bay- Upper cover with captive screw- Drive bay with shock and vibration resistant design- Replaceable and easy-to-clean air filter- 12cm cooling fan (85CFM)- Two USB and one PS/2 keyboard connectors on front panel
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ADLINK Technology Inc.
A wide range of ADLINK backplanes are available for PICMG CPU cards. They are the most flexible and expansible solutions for industrial slot-hungry applications.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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58131 -
Chroma ATE Inc.
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.